Superpave
In-Situ Stress
Strain Investigation
Instrumentation
Overview
Strain
Gauges
The
Dynatest PAST II Strain Gauge is designed for the measurement of in-situ
stresses and strains in Asphalt Concrete, or Portland Cement Concrete.
This type of embedment gage consists of an electrical resistance strain
gage embedded within a strip of glass-fiber reinforced epoxy surrounded
by several protective layers. Stress and strain measurements are critical
measurements to determine the performance of pavement sections including
the service life as a function of the number of imposed wheel loads.
Depending on the specific location, strain gauge quantities and grade
level orientations vary.

Multi-Depth
Deflectomer
a
deflectometer is a probe that contains an LVDT in the central core.
The Schaevitz Single Layer Deflectometer is an in-house apparatus
that incorporates a Schaevitz LVDT. The LVDT converts a measured voltage
source to a linear displacement output of the pavement structure.
The CTL Multi-Depth Deflectometer functions similarly to the single
layer, however data con be simultaneously obtained from multiple LVDT’s
in each layer of the pavement structure. The MDD is used to measure
in situ elastic deflections and permanent deformations in the various
pavements layers of a test section. Multi-Depth Deflectometers are
used to measure "in-situ" elastic deflections and/or permanent
deformations in the various pavement layers of a test section. During
testing, the permanent deformation at each module is recorded, as
are the elastic deformation basins under the test wheel loads. The
plastic deformation data is used to develop transfer functions relating
load repetition to plastic strain in the road building materials.
The deflection data can be used to determine the effective elastic
moduli for each pavement layer.

Moisture
Content Reflectometers
The
Campbell Scientific Moisture Content Reflectometer measures the volumetric
water content of porous media using time-domain measurement methods.
The probe consists of two stainless steel rods connected to a PCB.
A shielded 4-conductor cable is connected to the circuit board to
supply power, enable the probe and monitor the pulse output. The circuit
board is potted in an epoxy block. Water content measurements coincide
with frost depth measurements as both contribute to pavement weakening
and load bearing limitations.
Thermocouples
In
house thermocouples were fabricated using Omega Engineering Type–T
thermocouple wire. Thermocouple wire consists of a shielded soldered
twisted strand pair of wire. T-type thermocouples are useful in providing
accurate reading of heat variations inside a pavement system. Depending
on the location, multiple thermocouples were wired to a device with
multiplexing capability such that simultaneous temperature measurements
could be made in various layers of the pavement structure.
Resistivity
Probes
In
cold regions freeze-thaw cycling, and spring time thaw weakening contribute
to loss of load bearing capacity and subsequent pavement failure.
Determining frost depth below the pavement becomes important for timely
implementation of winter and spring load limits. The ABF Manufacturing
Frost Depth Resistivity Probe (FDRP) relies on an electrical resistance
measurement obtained between the conductors mounted along the cylindrical
core of the probe. The frost depth determination is made by the definitive
gradient between frozen soil resisitivity (500,000 Ohms on) and unfrozen
soil (20,000 to 50,000 Ohms typical). Resistance measurements are
obtained along discrete intervals along the probe to determine the
frost location.
Site
Instruments
Site
No. |
County |
Highway |
Instruments |
Status |
Pavement
Structure |
Site
1 |
Tioga |
SR15 |
Pressure
Cell, Resistivity Probe, Thermocouples, TDR, MDD, Strain Gauge |
Complete |
Full
Depth Construction |
Site
2 |
Mercer |
I-80 |
Pressure
Cell, Resistivity Probe, Thermocouples, TDR, MDD, Strain Gauge |
Complete |
Full
Depth Construction |
Site
3 |
Mercer |
I-80 |
Resistivity
Probe, TDR, Thermocouples, MDD, Strain Gauge |
Complete |
Structural
Overlay |
Site
4 |
Warren |
SR6 |
Resistivity
Probe, Thermocouple, MDD, Strain Gauge |
Complete |
Structural
Overlay |
Site
5 |
Perry |
SR22 |
Resistivity
Probe, Thermocpuples, MDD, Strain Gauge |
Complete |
Structural
Overlay |
Data Acquisition
There
are currently two types of data acquisition components utilized for
field data acquisition and analysis, the IOtech Wavebook (Wavebook)
series dynamic testing and analysis data- logger, and The Campbell
Scientific static testing and analysis datalogger. These components
have been selected on the basis of compatibility, ability to accommodate
multi-channel parameters, and maintain the ability to have field data
downloaded remotely from a PC based laboratory site. Once data has
been obtained in the field, two software packages provide a sufficient
means of analysis. DasyLab and Wavebook compatible program DIAdem
allow for in depth examination of dynamic data. Similarly, the PC208
Datalogger Control Software is used for analysis of static data.
The Wavebook consists of a series of rack-mounted components that
are required to obtain all parameters of the dynamic data. The Wavebook
is transported to an instrumentation site each time dynamic data is
required. The Wavebook is connected to the instrumentation wires via
direct connection or the instrumentation junction box interconnects.
Once data acquisition is taken and stored to hard disk, it is then
filtered and analyzed with the use of DasyLab. Examples of dynamic
data can be found in Appendix A: Data Analysis Results The Campbell
Scientific CR23X has been employed to monitor the static data at each
instrumentation site. Pedestals are found at each location that shelter
the CR23X and allow for remote acquisition via dial up modem connection.
The static data is filed to the CR23X internal memory source capable
of handling up to 4MB of data. Prior to exceed this limit, static
data is downloaded to a base station PC for permanent storage/data
basing and further analysis. Examples of static data can be found
in Appendix A: Data Analysis Results.